General Information

The Federal University of Minas Gerais (UFMG) is a member of the Cadence University Program and this web page will outline how Cadence products are used on our campus. This web page only describes the courses and research projects that use Cadence products, other software may also be used but that is irrelevant to the topic of this page.

Main Class Activities

  • Computer Architectures (undergraduate)
  • Fundamentals of VLSI (undergraduate)
  • Image Detection and Analysis (graduate)
  • Technology of Semiconductor Devices (undergraduate)
  • VLSI Systems (graduate)
  • Microelectronics Processes and Equipments (graduate)
  • Test and Verification of Microelectronic Circuits (graduate)
  • Microtransducers (undergraduate / graduate)

Main Research Projects

  • The National Institute of Science and Technology on Semiconductor Nanodevices - DISSE combines nine of the best Brazilian institutions and is supported by Brazilian state and federal governments. The institute comprises the investigation and development of semiconductor nanostructures for the fabrication of optoelectronic devices with emphasis on infrared photodetectors and novel devices based on purely quantum effects not yet explored. In the Institute both the development of innovative technologies as well as basic science should be contemplated through forefront research competitive with international standards.
  • The National Institute of Science and Technology on Micro and Nanoelectronic Systems - INCT NAMITEC - is a network that brings together the main institutions that develop nano- and microelectronics in Brazil. There are a total of 25 research centers and universities spread across 12 states in the five regions of the country. With 64 researchers, NAMITEC has a broad scope in micro- and nanoelectronics, with research and actions in the study of wireless sensor networks, IoT, embedded systems, integrated circuit design, device studies, materials and manufacturing techniques and human resources, with many application.
  • Nanoelectronics robust against radiation based transition faults - This project focuses on the characterization and optimization of sensors for detection of radiation based transition faults and the automatic insertion of these sensors in integrated systems. The novelty of this project is the realization of the applicability of this promising technique that concentrates on one of the most critical error sources of integrated circuits in the nanometer scale. Already fabricated sensors shall be characterized with the intention to extract possible improvements and to enable the integration into commercial CAD design flows. The subjects of this proposal demand the knowledge of mixed-signal systems and effects in CMOS technologies in the nanometer scale as well as the cooperation between several research groups. Expected outcomes are contribution of innovation to a relevant reliability problem, design of a prototype and the formation of human resources.
  • Development of microelectronic and optronic components - The objective is the study and development of various components and devices involving: analog and digital integrated circuits in standard CMOS technology, optical sensors integrated in CMOS technology, micromachining for ophthalmic optics, photovoltaic cells and solar modules.
  • Reliable Nanoelectronics Systems - The in this project considered essential problems of integration of novel nanotechnologies in digital systems are modeling, synthesis, placement and routing, verification, and reliability. Thereby, the focus is on the promising technologies Quantum-Dot Cellular Automata (QCA) and Carbon Nanotubes (CNT). The intention of this project is the development, optimization, and implementation of concepts in order to enhance integratability and reliability of these technologies. Another aspect is the integration of reliability related analyzes and solutions. It is expected that future technologies in the nanoscale range, including CMOS as well as post-CMOS, require strong consideration of reliability related issues during the design phase. Hence, this project shall develop a fault-tolerant design methodology that extends exiting design flows. Thereby, reliability estimation as well as integration of robustness enhancing techniques shall be supported.
  • Development of a Robust ARM Processor for Embedded Systems - The principal objective of this project is the exploration of concepts that address key issues in integrated circuits in current and future technologies. Through this, following specific objectives consolidate the continuity of research in progress, like consolidation of an innovative solution proposed by Brazilian institutions to resolve the susceptibility of integrated systems against radiation-induced faults and an robust ARM architecture processor for application in embedded systems.


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Contact: Prof. Dr. Frank Sill Torres

Last update: February 28, 2018